3 article(s) from Zhang, Yi

Scanning probe microscopy for energy-related materials

  • Rüdiger Berger,
  • Benjamin Grévin,
  • Philippe Leclère and
  • Yi Zhang

Beilstein J. Nanotechnol. 2019, 10, 132–134, doi:10.3762/bjnano.10.12

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Published 10 Jan 2019

Electrostatic force spectroscopy revealing the degree of reduction of individual graphene oxide sheets

  • Yue Shen,
  • Ying Wang,
  • Yuan Zhou,
  • Chunxi Hai,
  • Jun Hu and
  • Yi Zhang

Beilstein J. Nanotechnol. 2018, 9, 1146–1155, doi:10.3762/bjnano.9.106

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Published 11 Apr 2018

Nanoscale mapping of dielectric properties based on surface adhesion force measurements

  • Ying Wang,
  • Yue Shen,
  • Xingya Wang,
  • Zhiwei Shen,
  • Bin Li,
  • Jun Hu and
  • Yi Zhang

Beilstein J. Nanotechnol. 2018, 9, 900–906, doi:10.3762/bjnano.9.84

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Published 16 Mar 2018
 
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